A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...

A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

As the semiconductor world excitingly explores the potential of new advanced package solutions for their intricate and novel designs, challenges arise from undetected defects caused by the complexity ...

Schematic overview of defect engineering for advanced electrocatalytic conversion of nitrogen-containing molecules. Credit: Science China Press The nitrogen cycle, one of the most important ...

An international research team has pioneered a new technique to identify and characterize atomic-scale defects in hexagonal boron nitride (hBN), a two-dimensional (2D) material often dubbed 'white ...

An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize ...

Defect engineering has emerged as a powerful strategy to tailor the activity and stability of electrocatalysts for oxygen reduction and evolution reactions. By intentionally introducing vacancies, ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

This study is led by Prof. Shuangyin Wang (College of Chemistry and Chemical Engineering, Hunan University) and Prof. Chen Chen (College of Chemistry and Chemical Engineering, Hunan University).