YouTube has officially altered the outlook for digital video creators and viewers by transitioning from a voluntary AI disclosure policy to a mandatory, automated detection system. Under the ...

As AI video models become more powerful, YouTube is no longer solely relying on creators to label their AI videos — it will now automatically label videos on their behalf. The company announced on ...

It's been only a few months since OpenAI released its last big improvement to AI image generations in ChatGPT and through its application programming interface (API) — namely, a new image generation ...

Last month, a local TikToker posted a photo of a Denver Art Museum label, with this text: “Saw my first AI-generated museum label at the Denver Art Museum” accompanied by screaming audio. The label, ...

Elon Musk’s X is the latest social network to roll out a feature to label edited images as “manipulated media,” if a post by Elon Musk is to be believed. But the company has not clarified how it will ...

Social media companies and their respective algorithms have repeatedly been accused of fueling political polarization by promoting divisive content on their platforms. Now, two U.S. Senators have ...

In keeping with years of recommendations from universities and education advocates that teachers be involved in the development of ed-tech tools, the interactive learning platform Wooclap recently ...

Commentary: I'm seeing the AI label abused more and more often at tech shows as brands try to push it into everything, correct or not. Tyler has worked on, lived with and tested all types of smart ...

Abstract: In real-life scenarios, the field-of-view angles captured by cameras are typically constrained. This has led to a growing demand for panoramic images to cater to various applications, such ...

A team of Monash University researchers have successfully piloted an algorithm to identify incorrect penicillin allergy labels and educate patients presenting to community pharmacies. Patients are ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.